Quartz single crystal, Y-cut, 10x10x0.1mm, 2 sp -- SOY101001S2
- Single crystal SiO2 (quartz)
- Size: 10 x 10 x 0.1 mm
- Orientation: Y-cut
- Polish: two sides polished
- Surface roughness: < 5 A ( by AFM)
- Packing: in 1000 class clean room by wafer carrier
|
Typical Physical Properties |
Purity Wt % |
Saw grade: > 99.9 Optical grade: 99.99 |
Crystal Structure |
Hex. a= 4.914 Å c = 5.405 Å |
Growth Method |
Hydrothermal |
Hardness |
7.0 Moh’s |
Density |
2.684 g/cm3 |
Melt Point |
1610 oC ( phase transition point: 573.1oC) |
Specific Heat |
0.18 cal/gm |
Thermoelectric Constant |
1200 mV/oC @ 300 oC |
Thermal Conductivity |
0.0033 cal/cm/ oC |
Thermal Expansion (x10-6/ oC) |
a11: 13.71 a33: 7.48 |
Index of Refraction |
1.544 |
|
Q Value Acoustic Velocity, SAW Frequency Constant, BAW Piezoelectric Coupling |
1.8 x 106 min. 3160 ( m/sec ) 1661 ( kHz/mm ) |
Inclusion |
IEC Grade II |
Original: $95.00
-65%$95.00
$33.25Quartz single crystal, Y-cut, 10x10x0.1mm, 2 sp -- SOY101001S2
- Single crystal SiO2 (quartz)
- Size: 10 x 10 x 0.1 mm
- Orientation: Y-cut
- Polish: two sides polished
- Surface roughness: < 5 A ( by AFM)
- Packing: in 1000 class clean room by wafer carrier
|
Typical Physical Properties |
Purity Wt % |
Saw grade: > 99.9 Optical grade: 99.99 |
Crystal Structure |
Hex. a= 4.914 Å c = 5.405 Å |
Growth Method |
Hydrothermal |
Hardness |
7.0 Moh’s |
Density |
2.684 g/cm3 |
Melt Point |
1610 oC ( phase transition point: 573.1oC) |
Specific Heat |
0.18 cal/gm |
Thermoelectric Constant |
1200 mV/oC @ 300 oC |
Thermal Conductivity |
0.0033 cal/cm/ oC |
Thermal Expansion (x10-6/ oC) |
a11: 13.71 a33: 7.48 |
Index of Refraction |
1.544 |
|
Q Value Acoustic Velocity, SAW Frequency Constant, BAW Piezoelectric Coupling |
1.8 x 106 min. 3160 ( m/sec ) 1661 ( kHz/mm ) |
Inclusion |
IEC Grade II |
Product Information
Product Information
Shipping & Returns
Shipping & Returns
Description
- Single crystal SiO2 (quartz)
- Size: 10 x 10 x 0.1 mm
- Orientation: Y-cut
- Polish: two sides polished
- Surface roughness: < 5 A ( by AFM)
- Packing: in 1000 class clean room by wafer carrier
|
Typical Physical Properties |
Purity Wt % |
Saw grade: > 99.9 Optical grade: 99.99 |
Crystal Structure |
Hex. a= 4.914 Å c = 5.405 Å |
Growth Method |
Hydrothermal |
Hardness |
7.0 Moh’s |
Density |
2.684 g/cm3 |
Melt Point |
1610 oC ( phase transition point: 573.1oC) |
Specific Heat |
0.18 cal/gm |
Thermoelectric Constant |
1200 mV/oC @ 300 oC |
Thermal Conductivity |
0.0033 cal/cm/ oC |
Thermal Expansion (x10-6/ oC) |
a11: 13.71 a33: 7.48 |
Index of Refraction |
1.544 |
|
Q Value Acoustic Velocity, SAW Frequency Constant, BAW Piezoelectric Coupling |
1.8 x 106 min. 3160 ( m/sec ) 1661 ( kHz/mm ) |
Inclusion |
IEC Grade II |
